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1 Ergebnisse
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Correction to ZnO/NiO Diode-Based Charge Trapping Layer for..:
Sun, Chergn-En
;
Chen, Chin-Yu
;
Chu, Ka-Lip
...
ACS Applied Materials & Interfaces. 7 (2015) 18 - p. 10067-10067 , 2015
Link:
https://doi.org/10.1021/acsami.5b03117
RT Journal T1 <Title>Correction to ZnO/NiO Diode-Based Charge Trapping Layer for Flash Memory Featuring Low Voltage Operation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsami.5b03117&Exemplar=1&LAN=DE A1 Sun, Chergn-En A1 Chen, Chin-Yu A1 Chu, Ka-Lip A1 Shen, Yung-Shao A1 Lin, Chia-Chun A1 Wu, Yung-Hsien PB American Chemical Society (ACS) YR 2015 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 7 IS 18 SP 10067 OP 10067 LK http://dx.doi.org/https://doi.org/10.1021/acsami.5b03117 DO https://doi.org/10.1021/acsami.5b03117 SF ELIB - SuUB Bremen
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