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1 Ergebnisse
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Nanoscale Characterization of Carrier Dynamic and Surface P..:
Chen, Weijian
;
Wen, Xiaoming
;
Latzel, Michael
...
ACS Applied Materials & Interfaces. 8 (2016) 46 - p. 31887-31893 , 2016
Link:
https://doi.org/10.1021/acsami.6b11675
RT Journal T1 <Title>Nanoscale Characterization of Carrier Dynamic and Surface Passivation in InGaN/GaN Multiple Quantum Wells on GaN Nanorods</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsami.6b11675&Exemplar=1&LAN=DE A1 Chen, Weijian A1 Wen, Xiaoming A1 Latzel, Michael A1 Heilmann, Martin A1 Yang, Jianfeng A1 Dai, Xi A1 Huang, Shujuan A1 Shrestha, Santosh A1 Patterson, Robert A1 Christiansen, Silke A1 Conibeer, Gavin PB American Chemical Society (ACS) YR 2016 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 8 IS 46 SP 31887 OP 31893 LK http://dx.doi.org/https://doi.org/10.1021/acsami.6b11675 DO https://doi.org/10.1021/acsami.6b11675 SF ELIB - SuUB Bremen
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