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1 Ergebnisse
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Defect Passivation by Amide-Based Hole-Transporting Interfa..:
Wang, Shin-Yu
;
Chen, Chih-Ping
;
Chung, Chung-Lin
...
ACS Applied Materials & Interfaces. 11 (2019) 43 - p. 40050-40061 , 2019
Link:
https://doi.org/10.1021/acsami.9b13952
RT Journal T1
Defect Passivation by Amide-Based Hole-Transporting Interfacial Layer Enhanced Perovskite Grain Growth for Efficient p–i–n Perovskite Solar Cells
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsami.9b13952&Exemplar=1&LAN=DE A1 Wang, Shin-Yu A1 Chen, Chih-Ping A1 Chung, Chung-Lin A1 Hsu, Chun-Wen A1 Hsu, Hsiang-Lin A1 Wu, Ting-Hsuan A1 Zhuang, Jia-Ying A1 Chang, Chia-Jui A1 Chen, Hao Ming A1 Chang, Yuan Jay PB American Chemical Society (ACS) YR 2019 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 11 IS 43 SP 40050 OP 40061 LK http://dx.doi.org/https://doi.org/10.1021/acsami.9b13952 DO https://doi.org/10.1021/acsami.9b13952 SF ELIB - SuUB Bremen
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