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1 Ergebnisse
1
Focused Ion Beam vs Focused Electron Beam Deposition of Cob..:
Jungwirth, Felix
;
Porrati, Fabrizio
;
Knez, Daniel
...
ACS Applied Nano Materials. 5 (2022) 10 - p. 14759-14770 , 2022
Link:
https://doi.org/10.1021/acsanm.2c03074
RT Journal T1
Focused Ion Beam vs Focused Electron Beam Deposition of Cobalt Silicide Nanostructures Using Single-Source Precursors: Implications for Nanoelectronic Gates, Interconnects, and Spintronics
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsanm.2c03074&Exemplar=1&LAN=DE A1 Jungwirth, Felix A1 Porrati, Fabrizio A1 Knez, Daniel A1 Sistani, Masiar A1 Plank, Harald A1 Huth, Michael A1 Barth, Sven PB American Chemical Society (ACS) YR 2022 SN 2574-0970 SN 2574-0970 JF ACS Applied Nano Materials VO 5 IS 10 SP 14759 OP 14770 LK http://dx.doi.org/https://doi.org/10.1021/acsanm.2c03074 DO https://doi.org/10.1021/acsanm.2c03074 SF ELIB - SuUB Bremen
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