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X-ray Diffraction Analysis of the Angular Stability of Self..:
Mostafavi Kashani, Seyed Mohammad
;
Kriegner, Dominik
;
Bahrami, Danial
...
ACS Applied Nano Materials. 2 (2019) 2 - p. 689-699 , 2019
Link:
https://doi.org/10.1021/acsanm.8b01677
RT Journal T1
X-ray Diffraction Analysis of the Angular Stability of Self-Catalyzed GaAs Nanowires for Future Applications in Solar-Light-Harvesting and Light-Emitting Devices
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsanm.8b01677&Exemplar=1&LAN=DE A1 Mostafavi Kashani, Seyed Mohammad A1 Kriegner, Dominik A1 Bahrami, Danial A1 Vogel, Jonas A1 Davtyan, Arman A1 Feigl, Ludwig A1 Schroth, Philipp A1 Jakob, Julian A1 Baumbach, Tilo A1 Pietsch, Ullrich PB American Chemical Society (ACS) YR 2019 SN 2574-0970 SN 2574-0970 JF ACS Applied Nano Materials VO 2 IS 2 SP 689 OP 699 LK http://dx.doi.org/https://doi.org/10.1021/acsanm.8b01677 DO https://doi.org/10.1021/acsanm.8b01677 SF ELIB - SuUB Bremen
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