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2 Ergebnisse
1
Far-Field Subdiffraction Imaging of Semiconductors Using No..:
Liu, Ning
;
Kumbham, Mahendar
;
Pita, Isabel
...
ACS Photonics. 3 (2016) 3 - p. 478-485 , 2016
Link:
https://doi.org/10.1021/acsphotonics.5b00716
2
Far-Field Subdiffraction Imaging of Semiconductors Using No..:
Liu, Ning
;
Kumbham, Mahendar
;
Pita, Isabel
...
ACS Photonics. 3 (2016) 3 - p. 478-485 , 2016
Link:
https://doi.org/10.1021/acsphotonics.5b00716
RT Journal T1
Far-Field Subdiffraction Imaging of Semiconductors Using Nonlinear Transient Absorption Differential Microscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsphotonics.5b00716&Exemplar=1&LAN=DE A1 Liu, Ning A1 Kumbham, Mahendar A1 Pita, Isabel A1 Guo, Yina A1 Bianchini, Paolo A1 Diaspro, Alberto A1 Tofail, Syed A. M. A1 Peremans, André A1 Silien, Christophe PB American Chemical Society (ACS) YR 2016 SN 2330-4022 SN 2330-4022 JF ACS Photonics VO 3 IS 3 SP 478 OP 485 LK http://dx.doi.org/https://doi.org/10.1021/acsphotonics.5b00716 DO https://doi.org/10.1021/acsphotonics.5b00716 SF ELIB - SuUB Bremen RT Journal T1
Far-Field Subdiffraction Imaging of Semiconductors Using Nonlinear Transient Absorption Differential Microscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_acsphotonics.5b00716&Exemplar=1&LAN=DE A1 Liu, Ning A1 Kumbham, Mahendar A1 Pita, Isabel A1 Guo, Yina A1 Bianchini, Paolo A1 Diaspro, Alberto A1 Tofail, Syed A. M. A1 Peremans, André A1 Silien, Christophe PB American Chemical Society (ACS) YR 2016 SN 2330-4022 SN 2330-4022 JF ACS Photonics VO 3 IS 3 SP 478 OP 485 LK http://dx.doi.org/https://doi.org/10.1021/acsphotonics.5b00716 DO https://doi.org/10.1021/acsphotonics.5b00716 SF ELIB - SuUB Bremen
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