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1 Ergebnisse
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In situ Electrical Characterization of the Thickness Depend..:
Liu, Shun-Wei
;
Lee, Chih-Chien
;
Tai, Hung-Lin
...
ACS Applied Materials & Interfaces. 2 (2010) 8 - p. 2282-2288 , 2010
Link:
https://doi.org/10.1021/am1003377
RT Journal T1 <Title>In situ Electrical Characterization of the Thickness Dependence of Organic Field-Effect Transistors with 1−20 Molecular Monolayer of Pentacene</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_am1003377&Exemplar=1&LAN=DE A1 Liu, Shun-Wei A1 Lee, Chih-Chien A1 Tai, Hung-Lin A1 Wen, Je-Min A1 Lee, Jiun-Haw A1 Chen, Chin-Ti PB American Chemical Society (ACS) YR 2010 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 2 IS 8 SP 2282 OP 2288 LK http://dx.doi.org/https://doi.org/10.1021/am1003377 DO https://doi.org/10.1021/am1003377 SF ELIB - SuUB Bremen
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