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1 Ergebnisse
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Structural, Optical, and Dielectric Properties of Bi1.5–xZn..:
Le Febvrier, A.
;
Galca, A. C.
;
Corredores, Y.
...
ACS Applied Materials & Interfaces. 4 (2012) 10 - p. 5227-5233 , 2012
Link:
https://doi.org/10.1021/am301152r
RT Journal T1
Structural, Optical, and Dielectric Properties of Bi1.5–xZn0.92–yNb1.5O6.92−δ Thin Films Grown by PLD on R-plane Sapphire and LaAlO3 Substrates
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_am301152r&Exemplar=1&LAN=DE A1 Le Febvrier, A. A1 Galca, A. C. A1 Corredores, Y. A1 Députier, S. A1 Bouquet, V. A1 Demange, V. A1 Castel, X. A1 Sauleau, R. A1 Lefort, R. A1 Zhang, L.Y. A1 Tanné, G. A1 Pintilie, L. A1 Guilloux-Viry, M. PB American Chemical Society (ACS) YR 2012 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 4 IS 10 SP 5227 OP 5233 LK http://dx.doi.org/https://doi.org/10.1021/am301152r DO https://doi.org/10.1021/am301152r SF ELIB - SuUB Bremen
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