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Density of States-Based Design of Metal Oxide Thin-Film Tra..:
Kim, Hyun-Suk
;
Park, Joon Seok
;
Jeong, Hyun-Kwang
...
ACS Applied Materials & Interfaces. 4 (2012) 10 - p. 5416-5421 , 2012
Link:
https://doi.org/10.1021/am301342x
RT Journal T1
Density of States-Based Design of Metal Oxide Thin-Film Transistors for High Mobility and Superior Photostability
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_am301342x&Exemplar=1&LAN=DE A1 Kim, Hyun-Suk A1 Park, Joon Seok A1 Jeong, Hyun-Kwang A1 Son, Kyoung Seok A1 Kim, Tae Sang A1 Seon, Jong-Baek A1 Lee, Eunha A1 Chung, Jae Gwan A1 Kim, Dae Hwan A1 Ryu, Myungkwan A1 Lee, Sang Yoon PB American Chemical Society (ACS) YR 2012 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 4 IS 10 SP 5416 OP 5421 LK http://dx.doi.org/https://doi.org/10.1021/am301342x DO https://doi.org/10.1021/am301342x SF ELIB - SuUB Bremen
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