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1 Ergebnisse
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Improving the Electrical Properties of Lanthanum Silicate F..:
Choi, Yu Jin
;
Lim, Hajin
;
Lee, Suhyeong
...
ACS Applied Materials & Interfaces. 6 (2014) 10 - p. 7885-7894 , 2014
Link:
https://doi.org/10.1021/am5012172
RT Journal T1 <Title>Improving the Electrical Properties of Lanthanum Silicate Films on Ge Metal Oxide Semiconductor Capacitors by Adopting Interfacial Barrier and Capping Layers</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_am5012172&Exemplar=1&LAN=DE A1 Choi, Yu Jin A1 Lim, Hajin A1 Lee, Suhyeong A1 Suh, Sungin A1 Kim, Joon Rae A1 Jung, Hyung-Suk A1 Park, Sanghyun A1 Lee, Jong Ho A1 Kim, Seong Gyeong A1 Hwang, Cheol Seong A1 Kim, HyeongJoon PB American Chemical Society (ACS) YR 2014 SN 1944-8244 SN 1944-8252 JF ACS Applied Materials & Interfaces VO 6 IS 10 SP 7885 OP 7894 LK http://dx.doi.org/https://doi.org/10.1021/am5012172 DO https://doi.org/10.1021/am5012172 SF ELIB - SuUB Bremen
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