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XRF-Analysis of Fine and Ultrafine Particles Emitted from L..:
Barthel, Mathias
;
Pedan, Vasilisa
;
Hahn, Oliver
...
Environmental Science & Technology. 45 (2011) 18 - p. 7819-7825 , 2011
Link:
https://doi.org/10.1021/es201590q
RT Journal T1 <Title>XRF-Analysis of Fine and Ultrafine Particles Emitted from Laser Printing Devices</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_es201590q&Exemplar=1&LAN=DE A1 Barthel, Mathias A1 Pedan, Vasilisa A1 Hahn, Oliver A1 Rothhardt, Monika A1 Bresch, Harald A1 Jann, Oliver A1 Seeger, Stefan PB American Chemical Society (ACS) YR 2011 SN 0013-936X SN 1520-5851 JF Environmental Science & Technology VO 45 IS 18 SP 7819 OP 7825 LK http://dx.doi.org/https://doi.org/10.1021/es201590q DO https://doi.org/10.1021/es201590q SF ELIB - SuUB Bremen
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