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In-Depth Investigation of the Carbon Microstructure of Sili..:
Faber, Kristin
;
Badaczewski, Felix
;
Oschatz, Martin
...
The Journal of Physical Chemistry C. 118 (2014) 29 - p. 15705-15715 , 2014
Link:
https://doi.org/10.1021/jp502832x
RT Journal T1
In-Depth Investigation of the Carbon Microstructure of Silicon Carbide-Derived Carbons by Wide-Angle X-ray Scattering
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_jp502832x&Exemplar=1&LAN=DE A1 Faber, Kristin A1 Badaczewski, Felix A1 Oschatz, Martin A1 Mondin, Giovanni A1 Nickel, Winfried A1 Kaskel, Stefan A1 Smarsly, Bernd M. PB American Chemical Society (ACS) YR 2014 SN 1932-7447 SN 1932-7455 JF The Journal of Physical Chemistry C VO 118 IS 29 SP 15705 OP 15715 LK http://dx.doi.org/https://doi.org/10.1021/jp502832x DO https://doi.org/10.1021/jp502832x SF ELIB - SuUB Bremen
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