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Atomic Force Microscope Based Kelvin Probe Measurements: A..:
Böhmisch, M.
;
Burmeister, F.
;
Rettenberger, A.
...
The Journal of Physical Chemistry B. 101 (1997) 49 - p. 10162-10165 , 1997
Link:
https://doi.org/10.1021/jp9728767
RT Journal T1 <Title>Atomic Force Microscope Based Kelvin Probe Measurements: Application to an Electrochemical Reaction</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_jp9728767&Exemplar=1&LAN=DE A1 Böhmisch, M. A1 Burmeister, F. A1 Rettenberger, A. A1 Zimmermann, J. A1 Boneberg, J. A1 Leiderer, P. PB American Chemical Society (ACS) YR 1997 SN 1520-6106 SN 1520-5207 JF The Journal of Physical Chemistry B VO 101 IS 49 SP 10162 OP 10165 LK http://dx.doi.org/https://doi.org/10.1021/jp9728767 DO https://doi.org/10.1021/jp9728767 SF ELIB - SuUB Bremen
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