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1 Ergebnisse
1
Self-Formed Exchange Bias of Switchable Conducting Filament..:
Son, Jong Yeog
;
Kim, Cheol Hwan
;
Cho, Jin Hyoung
..
ACS Nano. 4 (2010) 6 - p. 3288-3292 , 2010
Link:
https://doi.org/10.1021/nn100323x
RT Journal T1
Self-Formed Exchange Bias of Switchable Conducting Filaments in NiO Resistive Random Access Memory Capacitors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_nn100323x&Exemplar=1&LAN=DE A1 Son, Jong Yeog A1 Kim, Cheol Hwan A1 Cho, Jin Hyoung A1 Shin, Young-Han A1 Jang, Hyun M. PB American Chemical Society (ACS) YR 2010 SN 1936-0851 SN 1936-086X JF ACS Nano VO 4 IS 6 SP 3288 OP 3292 LK http://dx.doi.org/https://doi.org/10.1021/nn100323x DO https://doi.org/10.1021/nn100323x SF ELIB - SuUB Bremen
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