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1 Ergebnisse
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Few-Layer Graphene Characterization by Near-Field Scanning ..:
Talanov, Vladimir V.
;
Barga, Christopher Del
;
Wickey, Lee
...
ACS Nano. 4 (2010) 7 - p. 3831-3838 , 2010
Link:
https://doi.org/10.1021/nn100493f
RT Journal T1
Few-Layer Graphene Characterization by Near-Field Scanning Microwave Microscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1021_nn100493f&Exemplar=1&LAN=DE A1 Talanov, Vladimir V. A1 Barga, Christopher Del A1 Wickey, Lee A1 Kalichava, Irakli A1 Gonzales, Edward A1 Shaner, Eric A. A1 Gin, Aaron V. A1 Kalugin, Nikolai G. PB American Chemical Society (ACS) YR 2010 SN 1936-0851 SN 1936-086X JF ACS Nano VO 4 IS 7 SP 3831 OP 3838 LK http://dx.doi.org/https://doi.org/10.1021/nn100493f DO https://doi.org/10.1021/nn100493f SF ELIB - SuUB Bremen
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