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Atomic and electronic basis for the serrations of refractor..:
Wang, William Yi
;
Shang, Shun Li
;
Wang, Yi
...
npj Computational Materials. 3 (2017) 1 - p. , 2017
Link:
https://doi.org/10.1038/s41524-017-0024-0
RT Journal T1
Atomic and electronic basis for the serrations of refractory high-entropy alloys
UL https://suche.suub.uni-bremen.de/peid=cr-10.1038_s41524-017-0024-0&Exemplar=1&LAN=DE A1 Wang, William Yi A1 Shang, Shun Li A1 Wang, Yi A1 Han, Fengbo A1 Darling, Kristopher A. A1 Wu, Yidong A1 Xie, Xie A1 Senkov, Oleg N. A1 Li, Jinshan A1 Hui, Xi Dong A1 Dahmen, Karin A. A1 Liaw, Peter K. A1 Kecskes, Laszlo J. A1 Liu, Zi-Kui PB Springer Science and Business Media LLC YR 2017 SN 2057-3960 JF npj Computational Materials VO 3 IS 1 LK http://dx.doi.org/https://doi.org/10.1038/s41524-017-0024-0 DO https://doi.org/10.1038/s41524-017-0024-0 SF ELIB - SuUB Bremen
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