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1 Ergebnisse
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Robust autofocusing for scanning electron microscopy based ..:
Lee, Woojin
;
Nam, Hyeong Soo
;
Kim, Young Gon
...
Scientific Reports. 11 (2021) 1 - p. , 2021
Link:
https://doi.org/10.1038/s41598-021-00412-5
RT Journal T1
Robust autofocusing for scanning electron microscopy based on a dual deep learning network
UL https://suche.suub.uni-bremen.de/peid=cr-10.1038_s41598-021-00412-5&Exemplar=1&LAN=DE A1 Lee, Woojin A1 Nam, Hyeong Soo A1 Kim, Young Gon A1 Kim, Yong Ju A1 Lee, Jun Hee A1 Yoo, Hongki PB Springer Science and Business Media LLC YR 2021 SN 2045-2322 JF Scientific Reports VO 11 IS 1 LK http://dx.doi.org/https://doi.org/10.1038/s41598-021-00412-5 DO https://doi.org/10.1038/s41598-021-00412-5 SF ELIB - SuUB Bremen
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