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Defect visualization of Cu(InGa)(SeS)2 thin films using DLT..:
Heo, Sung
;
Chung, JaeGwan
;
Lee, Hyung-Ik
...
Scientific Reports. 6 (2016) 1 - p. , 2016
Link:
https://doi.org/10.1038/srep30554
RT Journal T1
Defect visualization of Cu(InGa)(SeS)2 thin films using DLTS measurement
UL https://suche.suub.uni-bremen.de/peid=cr-10.1038_srep30554&Exemplar=1&LAN=DE A1 Heo, Sung A1 Chung, JaeGwan A1 Lee, Hyung-Ik A1 Lee, Junho A1 Park, Jong-Bong A1 Cho, Eunae A1 Kim, KiHong A1 Kim, Seong Heon A1 Park, Gyeong Su A1 Lee, Dongho A1 Lee, Jaehan A1 Nam, Junggyu A1 Yang, JungYup A1 Lee, Dongwha A1 Cho, Hoon Young A1 Kang, Hee Jae A1 Choi, Pyung-Ho A1 Choi, Byoung-Deog PB Springer Science and Business Media LLC YR 2016 SN 2045-2322 JF Scientific Reports VO 6 IS 1 LK http://dx.doi.org/https://doi.org/10.1038/srep30554 DO https://doi.org/10.1038/srep30554 SF ELIB - SuUB Bremen
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