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1 Ergebnisse
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Impact and Origin of Interface States in MOS Capacitor with..:
Xia, Pengkun
;
Feng, Xuewei
;
Ng, Rui Jie
...
Scientific Reports. 7 (2017) 1 - p. , 2017
Link:
https://doi.org/10.1038/srep40669
RT Journal T1
Impact and Origin of Interface States in MOS Capacitor with Monolayer MoS2 and HfO2 High-k Dielectric
UL https://suche.suub.uni-bremen.de/peid=cr-10.1038_srep40669&Exemplar=1&LAN=DE A1 Xia, Pengkun A1 Feng, Xuewei A1 Ng, Rui Jie A1 Wang, Shijie A1 Chi, Dongzhi A1 Li, Cequn A1 He, Zhubing A1 Liu, Xinke A1 Ang, Kah-Wee PB Springer Science and Business Media LLC YR 2017 SN 2045-2322 JF Scientific Reports VO 7 IS 1 LK http://dx.doi.org/https://doi.org/10.1038/srep40669 DO https://doi.org/10.1038/srep40669 SF ELIB - SuUB Bremen
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