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In-depth multi-technique characterization of chromium–silic..:
Escobar Galindo, R.
;
Benito, N.
;
Duday, D.
...
Journal of Analytical Atomic Spectrometry. 27 (2012) 3 - p. 390 , 2012
Link:
https://doi.org/10.1039/c2ja10296j
RT Journal T1 <Title>In-depth multi-technique characterization of chromium–silicon mixed oxides produced by reactive ion beam mixing of the Cr/Si interface</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1039_c2ja10296j&Exemplar=1&LAN=DE A1 Escobar Galindo, R. A1 Benito, N. A1 Duday, D. A1 Fuentes, G. G. A1 Valle, N. A1 Herrero, P. A1 Vergara, L. A1 Joco, V. A1 Sanchez, O. A1 Arranz, A. A1 Palacio, C. PB Royal Society of Chemistry (RSC) YR 2012 SN 0267-9477 SN 1364-5544 JF Journal of Analytical Atomic Spectrometry VO 27 IS 3 SP 390 LK http://dx.doi.org/https://doi.org/10.1039/c2ja10296j DO https://doi.org/10.1039/c2ja10296j SF ELIB - SuUB Bremen
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