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Forensic analysis of glass by μ-XRF, SN-ICP-MS, LA-ICP-MS a..:
Trejos, Tatiana
;
Koons, Robert
;
Weis, Peter
...
Journal of Analytical Atomic Spectrometry. 28 (2013) 8 - p. 1270 , 2013
Link:
https://doi.org/10.1039/c3ja50128k
RT Journal T1 <Title>Forensic analysis of glass by μ-XRF, SN-ICP-MS, LA-ICP-MS and LA-ICP-OES: evaluation of the performance of different criteria for comparing elemental composition</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1039_c3ja50128k&Exemplar=1&LAN=DE A1 Trejos, Tatiana A1 Koons, Robert A1 Weis, Peter A1 Becker, Stefan A1 Berman, Ted A1 Dalpe, Claude A1 Duecking, Marc A1 Buscaglia, JoAnn A1 Eckert-Lumsdon, Tiffany A1 Ernst, Troy A1 Hanlon, Christopher A1 Heydon, Alex A1 Mooney, Kim A1 Nelson, Randall A1 Olsson, Kristine A1 Schenk, Emily A1 Palenik, Christopher A1 Pollock, Edward Chip A1 Rudell, David A1 Ryland, Scott A1 Tarifa, Anamary A1 Valadez, Melissa A1 van Es, Andrew A1 Zdanowicz, Vincent A1 Almirall, Jose PB Royal Society of Chemistry (RSC) YR 2013 SN 0267-9477 SN 1364-5544 JF Journal of Analytical Atomic Spectrometry VO 28 IS 8 SP 1270 LK http://dx.doi.org/https://doi.org/10.1039/c3ja50128k DO https://doi.org/10.1039/c3ja50128k SF ELIB - SuUB Bremen
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