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1 Ergebnisse
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The thickness-dependent band gap and defect features of ult..:
Xu, Ji-Ping
;
Zhang, Rong-Jun
;
Zhang, Yuan
...
Physical Chemistry Chemical Physics. 18 (2016) 4 - p. 3316-3321 , 2016
Link:
https://doi.org/10.1039/c5cp05592j
RT Journal T1 <Title>The thickness-dependent band gap and defect features of ultrathin ZrO2 films studied by spectroscopic ellipsometry</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1039_c5cp05592j&Exemplar=1&LAN=DE A1 Xu, Ji-Ping A1 Zhang, Rong-Jun A1 Zhang, Yuan A1 Wang, Zi-Yi A1 Chen, Lei A1 Huang, Qing-Hua A1 Lu, Hong-Liang A1 Wang, Song-You A1 Zheng, Yu-Xiang A1 Chen, Liang-Yao PB Royal Society of Chemistry (RSC) YR 2016 SN 1463-9076 SN 1463-9084 JF Physical Chemistry Chemical Physics VO 18 IS 4 SP 3316 OP 3321 LK http://dx.doi.org/https://doi.org/10.1039/c5cp05592j DO https://doi.org/10.1039/c5cp05592j SF ELIB - SuUB Bremen
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