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1 Ergebnisse
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NanoSIMS measurements of trace elements at the micron scale..:
Hao, Jia-Long
;
Yang, Wei
;
Luo, Yan
...
Journal of Analytical Atomic Spectrometry. 31 (2016) 12 - p. 2399-2409 , 2016
Link:
https://doi.org/10.1039/c6ja00279j
RT Journal T1 <Title>NanoSIMS measurements of trace elements at the micron scale interface between zircon and silicate glass</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1039_c6ja00279j&Exemplar=1&LAN=DE A1 Hao, Jia-Long A1 Yang, Wei A1 Luo, Yan A1 Hu, Sen A1 Yin, Qing-Zhu A1 Lin, Yang-Ting PB Royal Society of Chemistry (RSC) YR 2016 SN 0267-9477 SN 1364-5544 JF Journal of Analytical Atomic Spectrometry VO 31 IS 12 SP 2399 OP 2409 LK http://dx.doi.org/https://doi.org/10.1039/c6ja00279j DO https://doi.org/10.1039/c6ja00279j SF ELIB - SuUB Bremen
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