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1 Ergebnisse
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Non-destructive characterization of extended crystalline de..:
Schulze, Andreas
;
Strakos, Libor
;
Vystavel, Tomas
...
Nanoscale. 10 (2018) 15 - p. 7058-7066 , 2018
Link:
https://doi.org/10.1039/c8nr00186c
RT Journal T1
Non-destructive characterization of extended crystalline defects in confined semiconductor device structures
UL https://suche.suub.uni-bremen.de/peid=cr-10.1039_c8nr00186c&Exemplar=1&LAN=DE A1 Schulze, Andreas A1 Strakos, Libor A1 Vystavel, Tomas A1 Loo, Roger A1 Pacco, Antoine A1 Collaert, Nadine A1 Vandervorst, Wilfried A1 Caymax, Matty PB Royal Society of Chemistry (RSC) YR 2018 SN 2040-3364 SN 2040-3372 JF Nanoscale VO 10 IS 15 SP 7058 OP 7066 LK http://dx.doi.org/https://doi.org/10.1039/c8nr00186c DO https://doi.org/10.1039/c8nr00186c SF ELIB - SuUB Bremen
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