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Correlation between in situ structural and optical characte..:
Cesca, Tiziana
;
Scian, Carlo
;
Petronijevic, Emilija
...
Nanoscale. 12 (2020) 2 - p. 851-863 , 2020
Link:
https://doi.org/10.1039/c9nr09024j
RT Journal T1
Correlation between in situ structural and optical characterization of the semiconductor-to-metal phase transition of VO2 thin films on sapphire
UL https://suche.suub.uni-bremen.de/peid=cr-10.1039_c9nr09024j&Exemplar=1&LAN=DE A1 Cesca, Tiziana A1 Scian, Carlo A1 Petronijevic, Emilija A1 Leahu, Grigore A1 Li Voti, Roberto A1 Cesarini, Gianmario A1 Macaluso, Roberto A1 Mosca, Mauro A1 Sibilia, Concita A1 Mattei, Giovanni PB Royal Society of Chemistry (RSC) YR 2020 SN 2040-3364 SN 2040-3372 JF Nanoscale VO 12 IS 2 SP 851 OP 863 LK http://dx.doi.org/https://doi.org/10.1039/c9nr09024j DO https://doi.org/10.1039/c9nr09024j SF ELIB - SuUB Bremen
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