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Enhanced reliability of phase-change memory via modulation ..:
Han, Jeong Hwa
;
Jeong, Hun
;
Park, Hanjin
...
RSC Advances. 11 (2021) 36 - p. 22479-22488 , 2021
Link:
https://doi.org/10.1039/d1ra02210e
RT Journal T1
Enhanced reliability of phase-change memory via modulation of local structure and chemical bonding by incorporating carbon in Ge2Sb2Te5
UL https://suche.suub.uni-bremen.de/peid=cr-10.1039_d1ra02210e&Exemplar=1&LAN=DE A1 Han, Jeong Hwa A1 Jeong, Hun A1 Park, Hanjin A1 Kwon, Hoedon A1 Kim, Dasol A1 Lim, Donghyeok A1 Baik, Seung Jae A1 Kwon, Young-Kyun A1 Cho, Mann-Ho PB Royal Society of Chemistry (RSC) YR 2021 SN 2046-2069 JF RSC Advances VO 11 IS 36 SP 22479 OP 22488 LK http://dx.doi.org/https://doi.org/10.1039/d1ra02210e DO https://doi.org/10.1039/d1ra02210e SF ELIB - SuUB Bremen
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