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1 Ergebnisse
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A zircon LA-ICPMS reverse depth profiling analysis method a..:
Lu, Yao
;
Zhang, Liang-Liang
;
Liu, Li
...
Journal of Analytical Atomic Spectrometry. 39 (2024) 3 - p. 829-840 , 2024
Link:
https://doi.org/10.1039/d3ja00309d
RT Journal T1 <Title>A zircon LA-ICPMS reverse depth profiling analysis method and its geological application</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1039_d3ja00309d&Exemplar=1&LAN=DE A1 Lu, Yao A1 Zhang, Liang-Liang A1 Liu, Li A1 Zhu, Di-Cheng A1 Xie, Jin-Cheng A1 Wang, Qing PB Royal Society of Chemistry (RSC) YR 2024 SN 0267-9477 SN 1364-5544 JF Journal of Analytical Atomic Spectrometry VO 39 IS 3 SP 829 OP 840 LK http://dx.doi.org/https://doi.org/10.1039/d3ja00309d DO https://doi.org/10.1039/d3ja00309d SF ELIB - SuUB Bremen
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