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Enhancement of electrical stability of metal oxide thin-fil..:
Kim, Youngseok
;
Kim, Choongik
Journal of Materials Chemistry C. 11 (2023) 22 - p. 7121-7143 , 2023
Link:
https://doi.org/10.1039/d3tc00417a
RT Journal T1 <Title>Enhancement of electrical stability of metal oxide thin-film transistors against various stresses</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1039_d3tc00417a&Exemplar=1&LAN=DE A1 Kim, Youngseok A1 Kim, Choongik PB Royal Society of Chemistry (RSC) YR 2023 SN 2050-7526 SN 2050-7534 JF Journal of Materials Chemistry C VO 11 IS 22 SP 7121 OP 7143 LK http://dx.doi.org/https://doi.org/10.1039/d3tc00417a DO https://doi.org/10.1039/d3tc00417a SF ELIB - SuUB Bremen
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