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1 Ergebnisse
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Reliable I/V characteristics and long lifetime of porphyrin..:
Yao, Xinlei
;
Vonesch, Maxime
;
Guan, Lihao
...
Journal of Materials Chemistry C. 12 (2024) 12 - p. 4326-4335 , 2024
Link:
https://doi.org/10.1039/d3tc04142e
RT Journal T1 <Title>Reliable I/V characteristics and long lifetime of porphyrin-based single-molecule junctions</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1039_d3tc04142e&Exemplar=1&LAN=DE A1 Yao, Xinlei A1 Vonesch, Maxime A1 Guan, Lihao A1 Wytko, Jennifer A1 Weiss, Jean A1 Sun, Xiaonan A1 Lacroix, Jean-Christophe PB Royal Society of Chemistry (RSC) YR 2024 SN 2050-7526 SN 2050-7534 JF Journal of Materials Chemistry C VO 12 IS 12 SP 4326 OP 4335 LK http://dx.doi.org/https://doi.org/10.1039/d3tc04142e DO https://doi.org/10.1039/d3tc04142e SF ELIB - SuUB Bremen
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