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1 Ergebnisse
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Cross‐connection abatement in dense loosely coupled wireles..:
Kim, Nam Yoon
;
Yoon, Sang‐Woong
;
Kim, Chang‐Woo
Electronics Letters. 52 (2016) 7 - p. 553-555 , 2016
Link:
https://doi.org/10.1049/el.2015.3216
RT Journal T1
Cross‐connection abatement in dense loosely coupled wireless charging pad environments
UL https://suche.suub.uni-bremen.de/peid=cr-10.1049_el.2015.3216&Exemplar=1&LAN=DE A1 Kim, Nam Yoon A1 Yoon, Sang‐Woong A1 Kim, Chang‐Woo PB Institution of Engineering and Technology (IET) YR 2016 SN 0013-5194 SN 1350-911X JF Electronics Letters VO 52 IS 7 SP 553 OP 555 LK http://dx.doi.org/https://doi.org/10.1049/el.2015.3216 DO https://doi.org/10.1049/el.2015.3216 SF ELIB - SuUB Bremen
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