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1 Ergebnisse
1
Effect of Mg insertion on stress‐induced resistance drift i..:
Choi, C. M.
;
Oh, Y. T.
;
Lee, J. Y.
...
Electronics Letters. 52 (2016) 7 - p. 531-533 , 2016
Link:
https://doi.org/10.1049/el.2015.4299
RT Journal T1
Effect of Mg insertion on stress‐induced resistance drift in MgO‐based magnetic tunnel junctions
UL https://suche.suub.uni-bremen.de/peid=cr-10.1049_el.2015.4299&Exemplar=1&LAN=DE A1 Choi, C. M. A1 Oh, Y. T. A1 Lee, J. Y. A1 Sukegawa, H. A1 Mitani, S. A1 Song, Y.H. PB Institution of Engineering and Technology (IET) YR 2016 SN 0013-5194 SN 1350-911X JF Electronics Letters VO 52 IS 7 SP 531 OP 533 LK http://dx.doi.org/https://doi.org/10.1049/el.2015.4299 DO https://doi.org/10.1049/el.2015.4299 SF ELIB - SuUB Bremen
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