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Experimental characterisation of coaxial TSV transistor kee..:
Adamshick, Stephen
;
Northrup, Steven
;
Liehr, Michael
Micro & Nano Letters. 13 (2018) 10 - p. 1457-1459 , 2018
Link:
https://doi.org/10.1049/mnl.2018.5280
RT Journal T1
Experimental characterisation of coaxial TSV transistor keep out zones
UL https://suche.suub.uni-bremen.de/peid=cr-10.1049_mnl.2018.5280&Exemplar=1&LAN=DE A1 Adamshick, Stephen A1 Northrup, Steven A1 Liehr, Michael PB Institution of Engineering and Technology (IET) YR 2018 SN 1750-0443 SN 1750-0443 JF Micro & Nano Letters VO 13 IS 10 SP 1457 OP 1459 LK http://dx.doi.org/https://doi.org/10.1049/mnl.2018.5280 DO https://doi.org/10.1049/mnl.2018.5280 SF ELIB - SuUB Bremen
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