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1 Ergebnisse
1
Voltage division investigation of series short‐circuit faul..:
Jingwei, Zhang
;
Qiang, Wang
;
Weifeng, Zhang
.
IET Power Electronics. 16 (2022) 2 - p. 333-345 , 2022
Link:
https://doi.org/10.1049/pel2.12374
RT Journal T1
Voltage division investigation of series short‐circuit fault on SiC MOSFETs and Si IGBTs
UL https://suche.suub.uni-bremen.de/peid=cr-10.1049_pel2.12374&Exemplar=1&LAN=DE A1 Jingwei, Zhang A1 Qiang, Wang A1 Weifeng, Zhang A1 Guojun, Tan PB Institution of Engineering and Technology (IET) YR 2022 SN 1755-4535 SN 1755-4543 JF IET Power Electronics VO 16 IS 2 SP 333 OP 345 LK http://dx.doi.org/https://doi.org/10.1049/pel2.12374 DO https://doi.org/10.1049/pel2.12374 SF ELIB - SuUB Bremen
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