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Properties of nano-crystalline silicon thin film fabricated..:
Lee, Eun Hye
;
Lee, Su Woong
;
Eom, Young Ju
...
The European Physical Journal Applied Physics. 63 (2013) 2 - p. 20302 , 2013
Link:
https://doi.org/10.1051/epjap/2013130161
RT Journal T1 <Title>Properties of nano-crystalline silicon thin film fabricated by electron beam exposure</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1051_epjap_2013130161&Exemplar=1&LAN=DE A1 Lee, Eun Hye A1 Lee, Su Woong A1 Eom, Young Ju A1 Won, Hae Na A1 Jang, Jin A1 Moon, Byeong Yeon A1 Park, Kyu Chang PB EDP Sciences YR 2013 SN 1286-0042 SN 1286-0050 JF The European Physical Journal Applied Physics VO 63 IS 2 SP 20302 LK http://dx.doi.org/https://doi.org/10.1051/epjap/2013130161 DO https://doi.org/10.1051/epjap/2013130161 SF ELIB - SuUB Bremen
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