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Influence of base material thickness on spectrometry of sem..:
Šagátová, Andrea
;
Kurucová, Nikola
;
Kotorová, Soňa
...
EPJ Web of Conferences. 288 (2023) - p. 10013 , 2023
Link:
https://doi.org/10.1051/epjconf/202328810013
RT Journal T1
Influence of base material thickness on spectrometry of semiconductor detectors based on semi-insulating GaAs
UL https://suche.suub.uni-bremen.de/peid=cr-10.1051_epjconf_202328810013&Exemplar=1&LAN=DE A1 Šagátová, Andrea A1 Kurucová, Nikola A1 Kotorová, Soňa A1 Kováčová, Eva A1 Zaťko, Bohumír A1 Lyoussi, A. A1 D'Errico, F. A1 Carette, M. A1 Joyce, M. A1 Hodák, R. A1 Jenčič, I. A1 Le Dû, P. A1 Morichi, M. A1 Pospíšil, S. A1 Reynard-Carette, C. A1 Snoj, L. A1 Vermeeren, L. PB EDP Sciences YR 2023 SN 2100-014X JF EPJ Web of Conferences VO 288 SP 10013 LK http://dx.doi.org/https://doi.org/10.1051/epjconf/202328810013 DO https://doi.org/10.1051/epjconf/202328810013 SF ELIB - SuUB Bremen
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