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Extending the measurement capabilities of 3D X-ray microsco..:
Villarraga-Gómez, Herminso
;
Kotwal, Naomi
;
Zarnetta, Robert
International Journal of Metrology and Quality Engineering. 15 (2024) - p. 5 , 2024
Link:
https://doi.org/10.1051/ijmqe/2024002
RT Journal T1 <Title>Extending the measurement capabilities of 3D X-ray microscopy to dimensional metrology</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1051_ijmqe_2024002&Exemplar=1&LAN=DE A1 Villarraga-Gómez, Herminso A1 Kotwal, Naomi A1 Zarnetta, Robert PB EDP Sciences YR 2024 SN 2107-6847 JF International Journal of Metrology and Quality Engineering VO 15 SP 5 LK http://dx.doi.org/https://doi.org/10.1051/ijmqe/2024002 DO https://doi.org/10.1051/ijmqe/2024002 SF ELIB - SuUB Bremen
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