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1 Ergebnisse
1
In situ measurements of critical layer thickness and optica..:
Elman, B.
;
Koteles, Emil S.
;
Melman, P.
...
Applied Physics Letters. 55 (1989) 16 - p. 1659-1661 , 1989
Link:
https://doi.org/10.1063/1.102279
RT Journal T1
In situ measurements of critical layer thickness and optical studies of InGaAs quantum wells grown on GaAs substrates
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.102279&Exemplar=1&LAN=DE A1 Elman, B. A1 Koteles, Emil S. A1 Melman, P. A1 Jagannath, C. A1 Lee, Johnson A1 Dugger, D. PB AIP Publishing YR 1989 SN 0003-6951 SN 1077-3118 JF Applied Physics Letters VO 55 IS 16 SP 1659 OP 1661 LK http://dx.doi.org/https://doi.org/10.1063/1.102279 DO https://doi.org/10.1063/1.102279 SF ELIB - SuUB Bremen
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