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1 Ergebnisse
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A swept two-frequency microwave reflectometer for edge dens..:
Hanson, G. R.
;
Wilgen, J. B.
;
Bigelow, T. S.
..
Review of Scientific Instruments. 63 (1992) 10 - p. 4658-4660 , 1992
Link:
https://doi.org/10.1063/1.1143654
RT Journal T1 <Title>A swept two-frequency microwave reflectometer for edge density profile measurements on TFTR</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.1143654&Exemplar=1&LAN=DE A1 Hanson, G. R. A1 Wilgen, J. B. A1 Bigelow, T. S. A1 Collazo, I. A1 Thomas, C. E. PB AIP Publishing YR 1992 SN 0034-6748 SN 1089-7623 JF Review of Scientific Instruments VO 63 IS 10 SP 4658 OP 4660 LK http://dx.doi.org/https://doi.org/10.1063/1.1143654 DO https://doi.org/10.1063/1.1143654 SF ELIB - SuUB Bremen
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