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1 Ergebnisse
1
Determination of concentration depth profiles using total-r..:
Günther, R.
;
Wiener, G.
;
Knoth, J.
..
Review of Scientific Instruments. 67 (1996) 6 - p. 2332-2336 , 1996
Link:
https://doi.org/10.1063/1.1146941
RT Journal T1 <Title>Determination of concentration depth profiles using total-reflection x-ray fluorescence spectrometry in combination with ion-beam etching</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.1146941&Exemplar=1&LAN=DE A1 Günther, R. A1 Wiener, G. A1 Knoth, J. A1 Schwenke, H. A1 Bormann, R. PB AIP Publishing YR 1996 SN 0034-6748 SN 1089-7623 JF Review of Scientific Instruments VO 67 IS 6 SP 2332 OP 2336 LK http://dx.doi.org/https://doi.org/10.1063/1.1146941 DO https://doi.org/10.1063/1.1146941 SF ELIB - SuUB Bremen
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