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1 Ergebnisse
1
Thin-oxide charging damage to microelectronic test structur..:
Friedmann, J. B.
;
Shohet, J. L.
;
McVittie, J. P.
.
Applied Physics Letters. 67 (1995) 25 - p. 3718-3720 , 1995
Link:
https://doi.org/10.1063/1.115360
RT Journal T1
Thin-oxide charging damage to microelectronic test structures in an electron-cyclotron-resonance plasma
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.115360&Exemplar=1&LAN=DE A1 Friedmann, J. B. A1 Shohet, J. L. A1 McVittie, J. P. A1 Ma, S. M. PB AIP Publishing YR 1995 SN 0003-6951 SN 1077-3118 JF Applied Physics Letters VO 67 IS 25 SP 3718 OP 3720 LK http://dx.doi.org/https://doi.org/10.1063/1.115360 DO https://doi.org/10.1063/1.115360 SF ELIB - SuUB Bremen
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