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Capacitance and conductance characterization of ferrocene-c..:
Li, Qiliang
;
Mathur, Guru
;
Homsi, Mais
...
Applied Physics Letters. 81 (2002) 8 - p. 1494-1496 , 2002
Link:
https://doi.org/10.1063/1.1500781
RT Journal T1
Capacitance and conductance characterization of ferrocene-containing self-assembled monolayers on silicon surfaces for memory applications
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.1500781&Exemplar=1&LAN=DE A1 Li, Qiliang A1 Mathur, Guru A1 Homsi, Mais A1 Surthi, Shyam A1 Misra, Veena A1 Malinovskii, Vladimir A1 Schweikart, Karl-Heinz A1 Yu, Lianhe A1 Lindsey, Jonathan S. A1 Liu, Zhiming A1 Dabke, Rajeev B. A1 Yasseri, Amir A1 Bocian, David F. A1 Kuhr, Werner G. PB AIP Publishing YR 2002 SN 0003-6951 SN 1077-3118 JF Applied Physics Letters VO 81 IS 8 SP 1494 OP 1496 LK http://dx.doi.org/https://doi.org/10.1063/1.1500781 DO https://doi.org/10.1063/1.1500781 SF ELIB - SuUB Bremen
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