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1 Ergebnisse
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Electrical properties of superfilled sub-micrometer silver ..:
Josell, D.
;
Burkhard, C.
;
Li, Y.
...
Journal of Applied Physics. 96 (2004) 1 - p. 759-768 , 2004
Link:
https://doi.org/10.1063/1.1757655
RT Journal T1 <Title>Electrical properties of superfilled sub-micrometer silver metallizations</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.1757655&Exemplar=1&LAN=DE A1 Josell, D. A1 Burkhard, C. A1 Li, Y. A1 Cheng, Y.-W. A1 Keller, R. R. A1 Witt, C. A. A1 Kelley, D. R. A1 Bonevich, J. E. A1 Baker, B. C. A1 Moffat, T. P. PB AIP Publishing YR 2004 SN 0021-8979 SN 1089-7550 JF Journal of Applied Physics VO 96 IS 1 SP 759 OP 768 LK http://dx.doi.org/https://doi.org/10.1063/1.1757655 DO https://doi.org/10.1063/1.1757655 SF ELIB - SuUB Bremen
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