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1 Ergebnisse
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Stress evolution in GaAsN alloy films:
Reason, M.
;
Weng, X.
;
Ye, W.
...
Journal of Applied Physics. 97 (2005) 10 - p. , 2005
Link:
https://doi.org/10.1063/1.1900289
RT Journal T1 <Title>Stress evolution in GaAsN alloy films</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.1900289&Exemplar=1&LAN=DE A1 Reason, M. A1 Weng, X. A1 Ye, W. A1 Dettling, D. A1 Hanson, S. A1 Obeidi, G. A1 Goldman, R. S. PB AIP Publishing YR 2005 SN 0021-8979 SN 1089-7550 JF Journal of Applied Physics VO 97 IS 10 LK http://dx.doi.org/https://doi.org/10.1063/1.1900289 DO https://doi.org/10.1063/1.1900289 SF ELIB - SuUB Bremen
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