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1 Ergebnisse
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High trap density and long retention time from self-assembl..:
Cha, Daigil
;
Shin, Jung H.
;
Park, Sangjin
...
Applied Physics Letters. 89 (2006) 24 - p. 243513 , 2006
Link:
https://doi.org/10.1063/1.2404586
RT Journal T1
High trap density and long retention time from self-assembled amorphous Si nanocluster floating gate nonvolatile memory
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.2404586&Exemplar=1&LAN=DE A1 Cha, Daigil A1 Shin, Jung H. A1 Park, Sangjin A1 Lee, Eunha A1 Park, Yoondong A1 Park, Youngsoo A1 Yoo, In-Kyeong A1 Seol, Kwang Soo A1 Choi, Suk-Ho PB AIP Publishing YR 2006 SN 0003-6951 SN 1077-3118 JF Applied Physics Letters VO 89 IS 24 SP 243513 LK http://dx.doi.org/https://doi.org/10.1063/1.2404586 DO https://doi.org/10.1063/1.2404586 SF ELIB - SuUB Bremen
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