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1 Ergebnisse
1
Tomography experiment of an integrated circuit specimen usi..:
Zhang, Hai-Bo
;
Zhang, Xiang-Liang
;
Wang, Yong
.
Review of Scientific Instruments. 78 (2007) 1 - p. , 2007
Link:
https://doi.org/10.1063/1.2409864
RT Journal T1
Tomography experiment of an integrated circuit specimen using 3MeV electrons in the transmission electron microscope
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.2409864&Exemplar=1&LAN=DE A1 Zhang, Hai-Bo A1 Zhang, Xiang-Liang A1 Wang, Yong A1 Takaoka, Akio PB AIP Publishing YR 2007 SN 0034-6748 SN 1089-7623 JF Review of Scientific Instruments VO 78 IS 1 LK http://dx.doi.org/https://doi.org/10.1063/1.2409864 DO https://doi.org/10.1063/1.2409864 SF ELIB - SuUB Bremen
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