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1 Ergebnisse
1
Optical capacitance-voltage characterization of charge trap..:
Lee, Jang Uk.
;
Roh, Kang Seob
;
Kang, Gu Cheol
...
Applied Physics Letters. 91 (2007) 22 - p. , 2007
Link:
https://doi.org/10.1063/1.2819092
RT Journal T1
Optical capacitance-voltage characterization of charge traps in the trapping nitride layer of charge trapped flash memory devices
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.2819092&Exemplar=1&LAN=DE A1 Lee, Jang Uk. A1 Roh, Kang Seob A1 Kang, Gu Cheol A1 Seo, Seung Hwan A1 Kim, Kwan Young A1 Lee, Sunyeong A1 Song, Kwan Jae A1 Choi, Chang Min A1 Park, So Ra A1 Park, Jun Hyun A1 Jeon, Ki Chan A1 Kim, Dae Hwan A1 Park, Byung-Gook A1 Lee, Jong Duk A1 Kim, Dong Myong PB AIP Publishing YR 2007 SN 0003-6951 SN 1077-3118 JF Applied Physics Letters VO 91 IS 22 LK http://dx.doi.org/https://doi.org/10.1063/1.2819092 DO https://doi.org/10.1063/1.2819092 SF ELIB - SuUB Bremen
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