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1 Ergebnisse
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Conduction-atomic force microscopy study of H2 sensing mech..:
Kumar, Manippady Krishna
;
Tan, Lee Kheng
;
Gosvami, Nitya Nanda
.
Journal of Applied Physics. 106 (2009) 4 - p. , 2009
Link:
https://doi.org/10.1063/1.3202344
RT Journal T1
Conduction-atomic force microscopy study of H2 sensing mechanism in Pd nanoparticles decorated TiO2 nanofilm
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.3202344&Exemplar=1&LAN=DE A1 Kumar, Manippady Krishna A1 Tan, Lee Kheng A1 Gosvami, Nitya Nanda A1 Gao, Han PB AIP Publishing YR 2009 SN 0021-8979 SN 1089-7550 JF Journal of Applied Physics VO 106 IS 4 LK http://dx.doi.org/https://doi.org/10.1063/1.3202344 DO https://doi.org/10.1063/1.3202344 SF ELIB - SuUB Bremen
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