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The reason for the increased threshold switching voltage of..:
Ryu, Seung Wook
;
Lee, Jong Ho
;
Ahn, Young Bae
...
Applied Physics Letters. 95 (2009) 11 - p. , 2009
Link:
https://doi.org/10.1063/1.3232237
RT Journal T1
The reason for the increased threshold switching voltage of SiO2 doped Ge2Sb2Te5 thin films for phase change random access memory
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.3232237&Exemplar=1&LAN=DE A1 Ryu, Seung Wook A1 Lee, Jong Ho A1 Ahn, Young Bae A1 Kim, Choon Hwan A1 Yang, Bong Seob A1 Kim, Gun Hwan A1 Kim, Soo Gil A1 Lee, Se-Ho A1 Hwang, Cheol Seong A1 Kim, Hyeong Joon PB AIP Publishing YR 2009 SN 0003-6951 SN 1077-3118 JF Applied Physics Letters VO 95 IS 11 LK http://dx.doi.org/https://doi.org/10.1063/1.3232237 DO https://doi.org/10.1063/1.3232237 SF ELIB - SuUB Bremen
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