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Erratum: "Angle-resolved phototelectron study on the struct..:
Aratani, Takashi
;
Higuchi, Masaaki
;
Sugawa, Shigetoshi
...
Journal of Applied Physics. 107 (2010) 6 - p. , 2010
Link:
https://doi.org/10.1063/1.3366705
RT Journal T1
Erratum: "Angle-resolved phototelectron study on the structures of silicon nitride films and Si3N4/Si interfaces formed using nitrogen-hydrogen radicals" [J. Appl. Phys. 104, 114112 (2008)]
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.3366705&Exemplar=1&LAN=DE A1 Aratani, Takashi A1 Higuchi, Masaaki A1 Sugawa, Shigetoshi A1 Ikenaga, Eiji A1 Ushio, Jiro A1 Nohira, Hiroshi A1 Suwa, Tomoyuki A1 Teramoto, Akinobu A1 Ohimi, Tadahiro A1 Hattori, Takeo PB AIP Publishing YR 2010 SN 0021-8979 SN 1089-7550 JF Journal of Applied Physics VO 107 IS 6 LK http://dx.doi.org/https://doi.org/10.1063/1.3366705 DO https://doi.org/10.1063/1.3366705 SF ELIB - SuUB Bremen
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