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Characterization of EL2 distribution on semi-insulating GaA..:
Wang, Faa-Ching
Journal of Applied Physics. 59 (1986) 11 - p. 3737-3742 , 1986
Link:
https://doi.org/10.1063/1.336758
RT Journal T1 <Title>Characterization of EL2 distribution on semi-insulating GaAs wafer by optically assisted imperfection profile</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.336758&Exemplar=1&LAN=DE A1 Wang, Faa-Ching PB AIP Publishing YR 1986 SN 0021-8979 SN 1089-7550 JF Journal of Applied Physics VO 59 IS 11 SP 3737 OP 3742 LK http://dx.doi.org/https://doi.org/10.1063/1.336758 DO https://doi.org/10.1063/1.336758 SF ELIB - SuUB Bremen
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